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TEMP 2000A便携式红外发射率/反射率测定仪,可在3-35 微米范围内测试半球反射率测试(total hemispherical reflectances) ,提供法线方向和 半球方向300K 环境条件下的发射率测定。
可取代已经停产的业界标准 Gier Dunkle DB 100 红外反射率测定计,并在性能和保养性方面都优于该型号反射计。并配备电池、充电器等,以及适应喷气式飞机飞行环境的便携箱,紧凑、轻便、适合在野外和实验室使用。符合ASTM E408 标准。
TEMP2000A中采用的光学元件、镀膜材料决定了其还可以在更宽的波长范围进行测试。
TESA2000是在TEMP 2000A基础上增加光谱半球反射率测定功能,光谱范围250 nm to 2500 nm ,主要用于太空材料太阳吸收特性测试。
Wavelength | <3um to="">35um (not limited by filters, windows, etc.) |
Measurement accuracy (for specular and diffuse samples) | - ± 1% of full scale for gray samples - ± 3% of full scale for non-gray samples |
Repeatability | - ± 0.5% of full scale or better |
Sample type | Any Sample, including foils, insulators, etc. |
Sample size and geometry | -Flat Surfaces: ≥ 0.4 inches (1 cm) diameter -Concave Surfaces: ≥ 6.5 inches (16.5 cm) diameter -Convex Surfaces: ≥ 1 inch (2.5 cm) diameter |
Sample temperature | Room Temperature, Ambient |
Displayed properties | -Infrared Reflectance -Normal Emittance (300K) -Hemispheric emittance (300K) |
Readouts | -Digital LCD panel meter |
Measurement range (reflectance) | 0.00 to 1.00 |
Dimensions | -Optical Head: 5.25" diameter x 6.8" long |
Weight | -Optical Head: 5 pounds -Control and Display Unit: 4 pounds -Carry Case: 11 pounds |
Warranty | 1 year parts and labor |