基于蓝宝石衬底的全区域覆盖的单层二硫化钨
产品简介
详细信息
This product contains full area coverage WS2 monolayers on c-cut sapphire substrates. Sample size measures 1cm in size and the entire sample surface contains monolayer thick WS2 sheet. Synthesized full area coverage monolayer WS2 is highly luminescent and Raman spectroscopy studies also confirm the monolayer thickness.
Sample Properties.
Sample size | 1cm x 1cm square shaped |
Substrate type | (0001) c-cut sapphire |
Coverage | Full coverage monolayer |
Electrical properties | 2.0 eV Direct Bandgap Semiconductor |
Crystal structure | Hexagonal Phase |
Unit cell parameters | a = b = 0.312 nm, c = 1.230 nm, α = β = 90, γ = 120° |
Production method | Low pressure Chemical Vapor Deposition (LPCVD) |
Characterization methods | Raman, photoluminescence, TEM, EDS |
Specifications
1) Full coverage * monolayer WS2 uniformly covered across c-cut sapphire
2) One centimeter in size. Larger sizes up to 2-inch wafer-scale available upon requests.
3) Atomically smooth surface with roughness < 0.2 nm.
4) Highly uniform surface morphology. WS2 monolayers uniformly cover across the sample.
5) 99.9995% purity as determined by nano-SIMS measurements
6) Repeatable Raman and photoluminescence response
7) High crystalline quality, Raman response, and photoluminescence emission comparable to single crystalline monolayer flakes.
8) c-cut Sapphire but our research and development team can transfer WS2 monolayers onto variety of substrates including PET, quartz, and SiO2/Si without significant compromisation of material quality.
9) WS2 monolayers do not contain intentional dopants or defects. However, our technical staff can produce defected WS2 using α-bombardment technique.
Supporting datasets [for * Full area WS2 coverage on c-cut Sapphire]
Transmission electron images (TEM) acquired from CVD grown full area coverage WS2 monolayers on c-cut sapphire confirming highly crystalline nature of monolayers
Energy dispersive X-ray spectroscopy (EDX) characterization on CVD grown full area coverage monolayer WS2 on c-cut sapphire confirming W:S 1:2 ratios
Room temperature photoluminescence spectroscopy (PL) and Raman spectroscopy (Raman) measurements performed on CVD grown full area coverage WS2 monolayers on c-cut sapphire. Raman spectroscopy measurement confirm monolayer nature of the CVD grown samples and PL spectrum display sharp and bright PL peak located at 2.00 eV in agreement with the literature.