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布鲁克 Bruker PI 89 扫描电镜纳米压痕仪
面议布鲁克Bruker 三维光学轮廓仪ContourGT-X
面议布鲁克 Bruker光学轮廓仪 ContourX-200
面议布鲁克Bruker 三维光学轮廓仪ContourX-100
面议布鲁克Bruker Dektak XT探针式轮廓仪
面议MicroChem 电子束光刻胶 PMMA
面议德国Eppendorf 多功能台式离心机5810R
面议美谷分子 多功能酶标仪 SpectraMax i3x
面议德国WIGGENS 微量台式离心机 BIOCEN 22
面议美国珀金埃尔默 PerkinElmer QSight 三重四极杆液质联用仪
面议Waters 三重四极杆质谱 Xevo TQ-S
面议赛默飞 三重四极杆液质联用仪TSQ Quantum Ultra
面议InSight AFP is the world’s highest performance and industry preferred CMP profiling and etch depth metrology system for advanced technology nodes. The combination of its modern tip scanner with inherently stable capacitive gauges and an accurate air-bearing positioning system enables non-destructive, direct measurements in the active area of dies.